Built-in test (BIT) has direct or indirect influence on reliability, maintainability, availability, lifecycle cost of the airborne electronic equipment. In this paper, we present a BIT optimization design approach based on the reliability. The impact of BIT on the system reliability is analyzed, and the BIT optimization design approach is mainly discussed. In the following, the NLIP (Non-Linear Integer Programming) model of the BIT optimization design is addressed, a demonstration results show that the system reliability and the performance of the BIT design are improved by the proposed approach.


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    Title :

    BIT optimization design of airborne electronic equipment based on reliability


    Contributors:
    Ma, Cun-bao (author) / Wang, Yan-wen (author) / Zhang, Wei (author) / Shi, Hao-shan (author)


    Publication date :

    2008-12-01


    Size :

    557776 byte




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English