Built-in test (BIT) has direct or indirect influence on reliability, maintainability, availability, lifecycle cost of the airborne electronic equipment. In this paper, we present a BIT optimization design approach based on the reliability. The impact of BIT on the system reliability is analyzed, and the BIT optimization design approach is mainly discussed. In the following, the NLIP (Non-Linear Integer Programming) model of the BIT optimization design is addressed, a demonstration results show that the system reliability and the performance of the BIT design are improved by the proposed approach.


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    Titel :

    BIT optimization design of airborne electronic equipment based on reliability


    Beteiligte:
    Ma, Cun-bao (Autor:in) / Wang, Yan-wen (Autor:in) / Zhang, Wei (Autor:in) / Shi, Hao-shan (Autor:in)


    Erscheinungsdatum :

    01.12.2008


    Format / Umfang :

    557776 byte




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



    Reliability life cycle of a complex electronic airborne equipment

    Mercurio, S.P. / Black, J.M. | Tema Archiv | 1975


    Airborne Electronic Equipment Guarantees

    Feduccia, A. J. / DeWitt, C. M. / Myers, R. H. | SAE Technical Papers | 1970


    Airborne Electronic Equipment Lifetime Guarantee

    C. M. DeWitt / R. H. Myers / D. A. Campbell et al. | NTIS | 1969