Summary form only given. Micro-ring resonators have generated much interest in the optical telecommunications community for their use as high-Q, low-loss channel drop filters. Many different variations in design and fabrication have been tested, including single and double ring designs, or disk types. Far-field optical microscopy has been used for characterization of these devices, but no attempt has yet been made at imaging the standing mode field patterns inside the micro-ring. The authors employ NSOM to map the internal optical modes of a micro-ring resonator.


    Access

    Check access

    Check availability in my library

    Order at Subito €


    Export, share and cite



    Title :

    Characterization of silicon micro-ring resonators using near-field scanning optical microscopy


    Contributors:
    Vander Rhodes, G.H. (author) / Goldberg, B.E. (author) / Unlu, M.S. (author) / Lim, D.R. (author) / Lee, K.K. (author)


    Publication date :

    1999-01-01


    Size :

    152689 byte




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



    Near-field Scanning Optical Microscopic Studies of Micro-ring Resonators

    IEEE | British Library Conference Proceedings | 1999


    Near-field scanning optical microscopic studies of micro-ring resonators

    Vander Rhodes, G.H. / Goldberg, B.B. / Unlu, M.S. et al. | IEEE | 1999



    Micro-ring resonators using polymer materials

    Rabiei, P. / Steier, W.H. | IEEE | 2001