Summary form only given. Micro-ring resonators have generated much interest in the optical telecommunications community for their use as high-Q, low-loss channel drop filters. Many different variations in design and fabrication have been tested, including single and double ring designs, or disk types. Far-field optical microscopy has been used for characterization of these devices, but no attempt has yet been made at imaging the standing mode field patterns inside the micro-ring. The authors employ NSOM to map the internal optical modes of a micro-ring resonator.


    Zugriff

    Zugriff prüfen

    Verfügbarkeit in meiner Bibliothek prüfen

    Bestellung bei Subito €


    Exportieren, teilen und zitieren



    Titel :

    Characterization of silicon micro-ring resonators using near-field scanning optical microscopy


    Beteiligte:
    Vander Rhodes, G.H. (Autor:in) / Goldberg, B.E. (Autor:in) / Unlu, M.S. (Autor:in) / Lim, D.R. (Autor:in) / Lee, K.K. (Autor:in)


    Erscheinungsdatum :

    1999-01-01


    Format / Umfang :

    152689 byte




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



    Near-field Scanning Optical Microscopic Studies of Micro-ring Resonators

    IEEE | British Library Conference Proceedings | 1999



    Micro-ring resonators using polymer materials

    Rabiei, P. / Steier, W.H. | IEEE | 2001



    WO5 Micro-Ring Resonators using Polymer Materials

    IEEE | British Library Conference Proceedings | 2001