Broad area laser diodes are excellent sources of light for high output power applications. The main factors limiting the output power, expected lifetime, and the reliability of these devices are thermal management and avoiding optical damage. The degradation effects are most pronounced at the laser facets. Therefore these regions are the most critical parts of the device. The study into the causes of degradation of laser diodes appears to be very important from fundamental and applied points of view. In this work we use photoluminescence microscopy (PLM) to investigate possible modes of failure of broad area laser diodes operated at high power.


    Access

    Check access

    Check availability in my library

    Order at Subito €


    Export, share and cite



    Title :

    Photoluminescence microscopy of mirror facets of broad area laser diodes


    Contributors:
    Andrianov, A.V. (author) / Dods, S.R.A. (author) / Morgan, J. (author) / Orton, J.W. (author) / Harrison, I. (author) / Larkins, E.C. (author) / Daiminger, F.X. (author) / Vassilakis, E. (author) / Hirtz, J.P. (author)


    Publication date :

    1997-01-01


    Size :

    245522 byte





    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



    Photoluminescence Microscopy of Mirror Facets of Broad Area Laser Diodes

    IEEE; Lasers and Electro-Optics Society | British Library Conference Proceedings | 1997



    InGaN SCH-MQW Laser Diodes With Ascleaved Facets

    Onomura, M. / Nishio, J. / Saito, S. et al. | IEEE | 1997


    Broad area DBR laser diodes with self-focussed output beam

    Yanson, D.A. / Rafailov, E.U. / Sokolovskii, G.S. et al. | IEEE | 2002


    MK3 Broad Area DBR Laser Diodes with Self-Focussed Output Beam

    IEEE | British Library Conference Proceedings | 2002