As an effective way of characterizing PLC devices, the incoherent interferometric technique measures discrete optical paths through the device so that detailed device/material properties and fabrication errors can be isolated. The technique is effective not only for AWGs (feed forward filter), but also ring resonators (auto regressive filter). A single measurement yields both passband power spectrum and dispersion property of the device.


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    Title :

    Incoherent interferometric measurement technique for PLC devices


    Contributors:
    Wei Chen, (author) / Zhipeng Wang, (author) / Chen, Y.J. (author)


    Publication date :

    2003-01-01


    Size :

    79525 byte




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



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