As an effective way of characterizing PLC devices, the incoherent interferometric technique measures discrete optical paths through the device so that detailed device/material properties and fabrication errors can be isolated. The technique is effective not only for AWGs (feed forward filter), but also ring resonators (auto regressive filter). A single measurement yields both passband power spectrum and dispersion property of the device.


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    Titel :

    Incoherent interferometric measurement technique for PLC devices


    Beteiligte:
    Wei Chen, (Autor:in) / Zhipeng Wang, (Autor:in) / Chen, Y.J. (Autor:in)


    Erscheinungsdatum :

    2003-01-01


    Format / Umfang :

    79525 byte




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



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