A study of laser diodes with different waveguide architectures by means of near-field scanning optical microscopy (NSOM) is presented. Mode profiles of waveguides are directly imaged and a novel contrast mechanism of NSOM is demonstrated.
Analysis of waveguide architectures of high-power diode lasers by near-field scanning optical microscopy
2001-01-01
148021 byte
Conference paper
Electronic Resource
English
British Library Conference Proceedings | 2001
|British Library Conference Proceedings | 1996
|British Library Conference Proceedings | 1996
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