We study the carrier-envelope phase sensitivity of the inversion in a two-band semiconductor and the influence of rapid dephasing of higher-lying states. The application of this effect for constructing a solid-state phase detector is investigated.


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    Title :

    Semiconductor-based carrier-envelope phase detector


    Contributors:
    Jirauschek, C. (author) / Duan, L. (author) / Mucke, O.D. (author) / Kaertner, F.X. (author) / Hof, K.D. (author) / Trirschler, T. (author) / Wegener, M. (author)


    Publication date :

    2004-01-01


    Size :

    174217 byte



    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



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