We report an experimental study of the reflection of s- and p-polarized subpicosecond THz-radiation pulses from silicon. We propose silicon reflection switches for electron bunch length measurement via THz wake field diagnostics.


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    Title :

    A femtosecond laser-activated silicon reflection switch for electron-beam bunch length measurements


    Contributors:
    Asazubi, R. (author) / Wilke, I. (author) / Zhong, H. (author) / Wang, S. (author) / Zhang, X.-C. (author) / Fisher, A. (author) / Bolton, P. (author) / Carr, R. (author) / Schlarb, H. (author)


    Publication date :

    2004-01-01


    Size :

    153667 byte



    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



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