We have demonstrated the use of confocal fluorescent microscopy in mapping the Cr/sup +3/ profile within the YAG crystal fiber. A sensitivity of 1.0/spl times/10/sup 17//cm/sup 3/ was achieved, which is more than an order of magnitude better than that of electron probe microanalysis.


    Access

    Check access

    Check availability in my library

    Order at Subito €


    Export, share and cite



    Title :

    Mapping of Cr ion profile in Cr:YAG crystal fiber by confocal microscopy


    Contributors:
    Chen, J.C. (author) / Lo, C.Y. (author) / Huang, S.L. (author)


    Publication date :

    2003-01-01


    Size :

    203970 byte



    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



    Mapping of Cr ions and refraction index profile in Cr:YAG crystal fiber with double-cladding structure

    Jian-Cheng Chen, / Chia-Yao Lo, / Kuang-Yao Huang, et al. | IEEE | 2004


    Fused-silica-clad Cr:YAG fiber

    Chia-Yao Lo, / Shih-Yu Tu, / Kuang-Yao Huang, et al. | IEEE | 2003


    280-nm amplified spontaneous emission generated by Cr:YAG crystal fiber

    Lo, C.V. / Huang, K.Y. / Tu, S.Y. et al. | IEEE | 2003


    Fabrication and photoluminescence properties of Cr:YAG and Yb,Cr:YAG transparent ceramic

    Chen, Xingtao / Lu, Tiecheng / Wei, Nian et al. | British Library Online Contents | 2015


    The use of fluorescence confocal microscopy in mapping Cr^+^3 profile within the YAG crystal fiber

    Chen, J.-C. / Lo, C.-Y. / Huang, S.-L. et al. | British Library Conference Proceedings | 2003