We have demonstrated the use of confocal fluorescent microscopy in mapping the Cr/sup +3/ profile within the YAG crystal fiber. A sensitivity of 1.0/spl times/10/sup 17//cm/sup 3/ was achieved, which is more than an order of magnitude better than that of electron probe microanalysis.
Mapping of Cr ion profile in Cr:YAG crystal fiber by confocal microscopy
2003-01-01
203970 byte
Aufsatz (Konferenz)
Elektronische Ressource
Englisch
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