We demonstrate a thermal profiling technique for wafer-scale testing of optical distribution in photonic integrated circuits. The technique is used to quantify the absorption coefficient of a subthreshold diode laser for varying operating conditions.
Wafer scale profiling of photonic integrated circuits
2003-01-01
192594 byte
Conference paper
Electronic Resource
English
Optical System Performance of Large-Scale Photonic Integrated Circuits
British Library Conference Proceedings | 2005
|InP photonic integrated circuits
IEEE | 2002
|Analysis of ultra-small photonic large scale integrated circuits
British Library Online Contents | 2004
|InP-based photonic integrated circuits
British Library Conference Proceedings | 2003
|