We demonstrate a thermal profiling technique for wafer-scale testing of optical distribution in photonic integrated circuits. The technique is used to quantify the absorption coefficient of a subthreshold diode laser for varying operating conditions.


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    Title :

    Wafer scale profiling of photonic integrated circuits


    Contributors:
    Hudgings, J.A. (author) / Pipe, K.P. (author) / Ram, R.J. (author)


    Publication date :

    2003-01-01


    Size :

    192594 byte



    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



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