In this paper we characterize temperature distribution in an electroabsorption modulator. A self-consistent opto-electro-thermal model is developed that accurately predicts thermal runaway in unoptimized EAM structures. Optimized structures with improved thermal design achieve high power operation with a record damage free power dissipation level in excess of 300 mW. In conclusion, using a thermoreflectance imaging technique, surface temperature measurement of active electroabsorption modulators is acquired.


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    Title :

    High power operation of electroabsorption modulators


    Contributors:
    Bian, Z. (author) / Christofferson, J. (author) / Shakouri, A. (author) / Kozodoy, P. (author)


    Publication date :

    2003-01-01


    Size :

    232294 byte



    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



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