In this paper we characterize temperature distribution in an electroabsorption modulator. A self-consistent opto-electro-thermal model is developed that accurately predicts thermal runaway in unoptimized EAM structures. Optimized structures with improved thermal design achieve high power operation with a record damage free power dissipation level in excess of 300 mW. In conclusion, using a thermoreflectance imaging technique, surface temperature measurement of active electroabsorption modulators is acquired.


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    Titel :

    High power operation of electroabsorption modulators


    Beteiligte:
    Bian, Z. (Autor:in) / Christofferson, J. (Autor:in) / Shakouri, A. (Autor:in) / Kozodoy, P. (Autor:in)


    Erscheinungsdatum :

    2003-01-01


    Format / Umfang :

    232294 byte



    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



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