In this paper we characterize temperature distribution in an electroabsorption modulator. A self-consistent opto-electro-thermal model is developed that accurately predicts thermal runaway in unoptimized EAM structures. Optimized structures with improved thermal design achieve high power operation with a record damage free power dissipation level in excess of 300 mW. In conclusion, using a thermoreflectance imaging technique, surface temperature measurement of active electroabsorption modulators is acquired.
High power operation of electroabsorption modulators
2003-01-01
232294 byte
Aufsatz (Konferenz)
Elektronische Ressource
Englisch
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