In this paper, we present an optical lithography process that introduces slot perturbations into a ridge waveguide InGaAsP laser. A fast-Fourier transform (FFT) of emission spectra below threshold has been used to verify the location of the slot and can be used as a method for measuring the loss introduced by the slot.


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    Title :

    Single mode edge-emitting lasers using optical lithography


    Contributors:
    Percival, C. (author) / Lambkin, P. (author) / Corbett, B. (author)


    Publication date :

    2003-01-01


    Size :

    66827 byte




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



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