In this paper, we present an optical lithography process that introduces slot perturbations into a ridge waveguide InGaAsP laser. A fast-Fourier transform (FFT) of emission spectra below threshold has been used to verify the location of the slot and can be used as a method for measuring the loss introduced by the slot.
Single mode edge-emitting lasers using optical lithography
2003-01-01
66827 byte
Conference paper
Electronic Resource
English
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