In this paper, we present an optical lithography process that introduces slot perturbations into a ridge waveguide InGaAsP laser. A fast-Fourier transform (FFT) of emission spectra below threshold has been used to verify the location of the slot and can be used as a method for measuring the loss introduced by the slot.
Single mode edge-emitting lasers using optical lithography
01.01.2003
66827 byte
Aufsatz (Konferenz)
Elektronische Ressource
Englisch
Proton Implanted Single Mode Holey Vertical-Cavity Surface-Emitting Lasers
British Library Conference Proceedings | 2005
|High-Performance GaInNAs-TQW Edge Emitting Lasers
IEEE | 2006
|British Library Conference Proceedings | 2004