In this paper, we present an optical lithography process that introduces slot perturbations into a ridge waveguide InGaAsP laser. A fast-Fourier transform (FFT) of emission spectra below threshold has been used to verify the location of the slot and can be used as a method for measuring the loss introduced by the slot.


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    Titel :

    Single mode edge-emitting lasers using optical lithography


    Beteiligte:
    Percival, C. (Autor:in) / Lambkin, P. (Autor:in) / Corbett, B. (Autor:in)


    Erscheinungsdatum :

    01.01.2003


    Format / Umfang :

    66827 byte




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



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