A failure diagnostic unit (144) obtains a control value for controlling an actuator (20) from each of a first processing circuit (11) and a second processing circuit (12) that are duplicated processing circuits. In a case where a first control value that has been obtained from the first processing circuit (11) does not match a second control value that has been obtained from the second processing circuit (12), the failure diagnostic unit (144) compares a state normal range with at least either the first control value or the second control value, and determines which of the first processing circuit (11) and the second processing circuit (12) an abnormality has occurred in, the state normal range being a range of a normal value of the control value that is estimated from a current operation state of a higher-order system that includes the actuator (20).


    Access

    Download


    Export, share and cite



    Title :

    Abnormality determination apparatus, abnormality determination method, and computer readable medium


    Contributors:

    Publication date :

    2021-05-18


    Type of media :

    Patent


    Type of material :

    Electronic Resource


    Language :

    English


    Classification :

    IPC:    G06F ELECTRIC DIGITAL DATA PROCESSING , Elektrische digitale Datenverarbeitung / B60W CONJOINT CONTROL OF VEHICLE SUB-UNITS OF DIFFERENT TYPE OR DIFFERENT FUNCTION , Gemeinsame Steuerung oder Regelung von Fahrzeug-Unteraggregaten verschiedenen Typs oder verschiedener Funktion / G07C TIME OR ATTENDANCE REGISTERS , Zeit- oder Anwesenheitskontrollgeräte



    Abnormality determination device, abnormality determination method, and computer-readable storage medium

    KIGAMI SHOGO / SAKURAI KYOKO / OGISO TAKANORI et al. | European Patent Office | 2024

    Free access

    Abnormality determination apparatus and abnormality determination method

    HASHIMOTO TOSHIYA / YOKOYAMA DAIKI | European Patent Office | 2025

    Free access

    ABNORMALITY DETERMINATION DEVICE, ABNORMALITY DETERMINATION SYSTEM, ABNORMALITY DETERMINATION METHOD, AND ABNORMALITY DETERMINATION PROGRAM

    ISHIKAWA KENTARO / KOKIDO TOMOYOSHI / FUJIYOSHI HIROKI | European Patent Office | 2023

    Free access

    ABNORMALITY DETERMINATION APPARATUS AND ABNORMALITY DETERMINATION METHOD

    HASHIMOTO TOSHIYA / YOKOYAMA DAIKI | European Patent Office | 2022

    Free access

    ABNORMALITY DETERMINATION DEVICE, ABNORMALITY DETERMINATION SYSTEM, ABNORMALITY DETERMINATION METHOD AND ABNORMALITY DETERMINATION PROGRAM

    FUJIYOSHI HIROKI / KOKIDO TOMOYOSHI / ISHIKAWA KENTARO et al. | European Patent Office | 2024

    Free access