To provide an abnormality sign determination device capable of detecting abnormality signs in an area wider than an artificial satellite itself.SOLUTION: Second sign determination means 74 holds a second model representing an output pattern and output timing of a satellite control system log when a satellite belonging to the satellite system, a terrestrial antenna, and a satellite control system are normal, and applies the newly obtained time series data of the satellite control system log to the second model, thereby determining whether or not there are any signs of abnormality for a part including the satellite, the terrestrial antenna, and the satellite control system.SELECTED DRAWING: Figure 6

    【課題】人工衛星自体より広い範囲を対象として、異常の予兆の検知を行える異常予兆判定装置を提供する。【解決手段】第2の予兆判定手段74は、衛星システムに属する人工衛星と、地上アンテナと、衛星管制システムとが正常である場合における衛星管制システムのログの出力パターンおよび出力タイミングを表す第2モデルを保持し、新たに得られた衛星管制システムのログの時系列データを第2モデルに適用することによって、人工衛星と地上アンテナと衛星管制システムとを含む部分を対象として、異常の予兆があるか否かを判定する。【選択図】図6


    Access

    Download


    Export, share and cite



    Title :

    ABNORMALITY SIGN DETERMINATION DEVICE AND ABNORMALITY SIGN DETERMINATION METHOD


    Additional title:

    異常予兆判定装置および異常予兆判定方法


    Contributors:

    Publication date :

    2025-01-24


    Type of media :

    Patent


    Type of material :

    Electronic Resource


    Language :

    Japanese


    Classification :

    IPC:    G05B Steuer- oder Regelsysteme allgemein , CONTROL OR REGULATING SYSTEMS IN GENERAL / B64G Raumfahrt , COSMONAUTICS



    ABNORMALITY SIGN DIAGNOSIS APPARATUS AND ABNORMALITY SIGN DIAGNOSIS METHOD

    ZHANG ZIXIAN / MUTO KAZUO / OKUDE MARIKO et al. | European Patent Office | 2021

    Free access

    ABNORMALITY DETERMINATION DEVICE, ABNORMALITY DETERMINATION SYSTEM, ABNORMALITY DETERMINATION METHOD, AND ABNORMALITY DETERMINATION PROGRAM

    ISHIKAWA KENTARO / KOKIDO TOMOYOSHI / FUJIYOSHI HIROKI | European Patent Office | 2023

    Free access

    ABNORMALITY DETERMINATION DEVICE, ABNORMALITY DETERMINATION SYSTEM, ABNORMALITY DETERMINATION METHOD AND ABNORMALITY DETERMINATION PROGRAM

    FUJIYOSHI HIROKI / KOKIDO TOMOYOSHI / ISHIKAWA KENTARO et al. | European Patent Office | 2024

    Free access

    ABNORMALITY DETERMINATION DEVICE, ABNORMALITY DETERMINATION METHOD, AND ABNORMALITY DETERMINATION PROGRAM

    NAGAYAMA HIROKI / NAGAFUCHI YUKIO / MIYAJIMA ASAMI | European Patent Office | 2023

    Free access

    ABNORMALITY DETERMINATION DEVICE, ABNORMALITY DETERMINATION METHOD, AND ABNORMALITY DETERMINATION PROGRAM

    OMORI YASUHIRO / ISHIKAWA HIROAKI | European Patent Office | 2018

    Free access