The invention provides a dual-system track inspection mechanism, which is used for measuring geometric parameters of a track, the track comprises a meter gauge and a standard gauge, and the dual-system track inspection mechanism comprises a mechanism main body; a control device which is arranged on the mechanism main body and is used for recording measurement data; a track detection device which is arranged on one side of the mechanism main body and is used for measuring the standard rail when being matched with the mechanism main body; wherein the track detection device comprises a track detection assembly and a connecting assembly connecting the track detection assembly and the mechanism body, the track detection assembly and the connecting assembly are arranged in a right-angle mode and form a T-shaped structure, both the track detection assembly and the connecting assembly can be connected with the mechanism body, and when the track detection assembly is connected with the mechanism body, the double-system track detection mechanism can be used for measuring a meter track. According to the dual-system track inspection mechanism, the track inspection device is arranged, so that the mechanism main body can be suitable for measurement of meter tracks and standard tracks after being matched with the track inspection device, on the other hand, the mechanism main body can be matched with a track through the track inspection device to directly perform measurement, and the overall measurement accuracy is improved.
本发明提供一种双制式轨检机构,用于测量轨道的几何参数,轨道包括米轨及标准轨,双制式轨检机构包括:机构主体;控制装置,设于机构主体上,用于记录测量数据;轨检装置,设于机构主体的一侧,与机构主体所适配时用于测量标准轨;其中,轨检装置包括轨检组件以及连接轨检组件与机构主体的连接组件,轨检组件与连接组件呈直角设置、且组成T型结构,轨检组件及连接组件均能与机构主体连接,当轨检组件与机构主体连接时,双制式轨检机构能够用于测量米轨。上述的双制式轨检机构,通过设置轨检装置,使得机构主体与轨检装置相适配后能够适用米轨及标准轨的测量,另一方面,通过轨检装置能够与轨道配合直接进行测量,提升了整体的测量精准度。
Double-system track inspection mechanism
一种双制式轨检机构
2021-10-08
Patent
Electronic Resource
Chinese
Online Contents | 2008