Thickness measurement by photothermal deflection method: influence of surface conductance
Schichtstaerkenmessung durch photometrische Ablenkung:Einfluesse des Oberflaechenleitwerts.
1996
7 pages
Isata-Proc.;96NM136;1996;29th ISATA, Proc.:Materials for Energy-Efficient Vehicles / Glass Technologies ...,Volume 2
Miscellaneous
English
Thickness Measurement by Photothermal Deflection Method: Influence of Surface Conductance
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