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    Title :

    Thickness measurement by photothermal deflection method: influence of surface conductance


    Additional title:

    Schichtstaerkenmessung durch photometrische Ablenkung:Einfluesse des Oberflaechenleitwerts.



    Publication date :

    1996


    Size :

    7 pages


    Remarks:

    Isata-Proc.;96NM136;1996;29th ISATA, Proc.:Materials for Energy-Efficient Vehicles / Glass Technologies ...,Volume 2


    Type of media :

    Miscellaneous


    Type of material :

    Print


    Language :

    English



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