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    Title :

    A new method of reliability testing for C-MOS VLSIs evaluation


    Additional title:

    Ein neues Verfahren fuer Zuverlaessigkeitstests an C-MOS VLSI


    Contributors:
    Himi,H. (author) / Hara,K. (author) / Mori,H. (author) / endo,K. (author) / Nippondenso,JP

    Publication date :

    1987


    Size :

    4 pages


    Remarks:

    SAE-Paper;871292;1987;Mobility:The Technical Challenge, 4.Int.Pacific Conf.on Automot.Engng.;SAE Proc.; P-212,Vol.2


    Type of media :

    Miscellaneous


    Type of material :

    Print


    Language :

    English



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