Access

    Access via TIB

    Check availability in my library


    Export, share and cite



    Title :

    High-accuracy CMM metrology for micro systems


    Additional title:

    Hoch genaue Koordinatenmessgeraete fuer Mikrosysteme.



    Publication date :

    2004


    Size :

    12 pages


    Remarks:

    VDI-Ber.; 2004;8th Int.Symposium on Measurement and Quality Control in Production;VDI-Berichte;Nr.;1860


    Type of media :

    Miscellaneous


    Type of material :

    Print


    Language :

    English



    High Accuracy Absolute Distance Metrology

    Swinkels, B. L. / European Space Agency / Centre Nationale d'Etudes Spatiales | British Library Conference Proceedings | 2006


    High-accuracy laser metrology enhances the VLTI

    Leveque, S. / Salvade, Y. / Dandliker, R. et al. | British Library Online Contents | 2002


    Camera model selection in high-accuracy 3D vision metrology

    Xiaoqing Zhong, / Ju Huo, / Ming Yang, et al. | IEEE | 2010


    Integrated High Accuracy Portable Metrology for Large Scale Structural Testing

    Klaas, A. / Richardson, P. / Burguete, R. et al. | British Library Conference Proceedings | 2014


    The Micro-arcsecond Metrology Testbed (MAM)

    Schmidtlin, E. / Savedra, R. / Lin, Y. et al. | NTRS | 1998