We analyze diffraction gratings via their resonances by a direct determination of the eigenmodes and the complex eigenfrequencies using a finite element method (FEM), that allows to study mono‐ or bi‐periodic gratings with a maximum versatility : complex shaped patterns, with anisotropic and graded index material, under oblique incidence and arbitrary polarization. In order to validate our method, we illustrate an example of a four layer dielectric slab, and compare the results with a specific method that we have called tetrachotomy, which gives us numerically the poles of the reflection coefficient (which corresponds to the eigenfrequencies of the structure).
Analysis of diffraction gratings via their resonances
THE FOURTH INTERNATIONAL WORKSHOP ON THEORETICAL AND COMPUTATIONAL NANOPHOTONICS: TaCoNa‐Photonics 2011 ; 2011 ; Bad Honnef, (Germany)
AIP Conference Proceedings ; 1398 , 1 ; 109-111
2011-10-03
3 pages
Conference paper
Electronic Resource
English
Analysis of diffraction gratings via their resonances
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