We analyze diffraction gratings via their resonances by a direct determination of the eigenmodes and the complex eigenfrequencies using a finite element method (FEM), that allows to study mono‐ or bi‐periodic gratings with a maximum versatility : complex shaped patterns, with anisotropic and graded index material, under oblique incidence and arbitrary polarization. In order to validate our method, we illustrate an example of a four layer dielectric slab, and compare the results with a specific method that we have called tetrachotomy, which gives us numerically the poles of the reflection coefficient (which corresponds to the eigenfrequencies of the structure).


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    Titel :

    Analysis of diffraction gratings via their resonances


    Beteiligte:

    Kongress:

    THE FOURTH INTERNATIONAL WORKSHOP ON THEORETICAL AND COMPUTATIONAL NANOPHOTONICS: TaCoNa‐Photonics 2011 ; 2011 ; Bad Honnef, (Germany)


    Erschienen in:

    AIP Conference Proceedings ; 1398 , 1 ; 109-111


    Erscheinungsdatum :

    03.10.2011


    Format / Umfang :

    3 pages





    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



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