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    Title :

    HOW GOOD IS GOOD? THE CHALLENGE OF MEASURFXENT BEYOND THE FACTORY


    Contributors:
    SUTTON, M. (author)

    Conference:

    2nd NASA Symposium on Quality and Productivity ; 1987 ; Washington , DC , U.S.A.



    Publication date :

    1987-01-01



    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



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