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    Title :

    Identification of Correlated Damage Parameters under Noise and Bias Using Bayesian Inference


    Contributors:
    An, Dawn (author) / Choi, Jooho (author) / Kim, Nam Ho (author)

    Conference:

    52nd AIAA/ASME/ASCE/AHS/ASC Structures, Structural Dynamics and Materials Conference



    Publication date :

    2011-01-01




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English




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    An, D. / Choi, J. / Kim, N.H. et al. | British Library Conference Proceedings | 2011




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