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    Title :

    Testability of micromachined silicon rate sensors


    Contributors:
    Jaffe, R. (author) / Heiertz, J. (author) / Ventresco, S. (author)

    Conference:

    Guidance, Navigation, and Control Conference ; 1997 ; New Orleans , LA , U.S.A.



    Publication date :

    1997-01-01



    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English




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