Access

    Check access

    Check availability in my library

    Order at Subito €


    Export, share and cite



    Title :

    In-Situ Imaging of Crack Growth with Piezoelectric-Wafer Active Sensors


    Author / Creator :

    Victor Giurgiutiu, Lingyu Yu, James Kendall, Christopher Jenkins


    Contributors:

    Published in:

    AIAA Journal ; 45 , 11 ; 2758-2769


    Publication date :

    2007




    Type of media :

    Article (Journal)


    Type of material :

    Electronic Resource


    Language :

    English



    In-Situ Imaging of Crack Growth with Piezoelectric Wafer Active Sensors

    Giurgiutiu, Victor / Jenkins, Christopher / Kendall, James et al. | AIAA | 2006


    AIAA-2006-2114 In-Situ Imaging of Crack Growth with Piezoelectric Wafer Active Sensors

    Giurgiutiu, V. / Jenkins, C. / Kendall, J. et al. | British Library Conference Proceedings | 2006



    Corrosion damage detection with piezoelectric wafer active sensors

    Thomas, D.T. / Welter, J.T. / Giurgiutiu, V. | Tema Archive | 2004