In-Situ Imaging of Crack Growth with Piezoelectric-Wafer Active Sensors
Victor Giurgiutiu, Lingyu Yu, James Kendall, Christopher Jenkins
AIAA Journal ; 45 , 11 ; 2758-2769
2007
Article (Journal)
Electronic Resource
English
AIAA-2006-2114 In-Situ Imaging of Crack Growth with Piezoelectric Wafer Active Sensors
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