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    Title :

    An approach to built-in testing on very large-scale integrated/very high-speed integrated circuitry devices


    Contributors:

    Conference:

    3rd Computers in Aerospace Conference ; 1981 ; San Diego , CA , U.S.A.



    Publication date :

    1981-01-01



    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



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