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    Titel :

    An approach to built-in testing on very large-scale integrated/very high-speed integrated circuitry devices


    Beteiligte:
    BOROFSKY, A. (Autor:in)

    Kongress:

    3rd Computers in Aerospace Conference ; 1981 ; San Diego , CA , U.S.A.



    Erscheinungsdatum :

    1981-01-01



    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



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