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    Title :

    Damage Diagnosis in Semiconductive Materials Using Electrical Impedance Measurements


    Contributors:

    Conference:

    49th AIAA/ASME/ASCE/AHS/ASC Structures, Structural Dynamics, and Materials Conference, 16th AIAA/ASME/AHS Adaptive Structures Conference,10th AIAA Non-Deterministic Approaches Conference, 9th AIAA Gossamer Spacecraft Forum, 4th AIAA Multidisciplinary Design Optimization Specialists Conference ; 2008 ; Schaumburg , IL



    Publication date :

    2008-01-01



    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



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