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    Titel :

    Damage Diagnosis in Semiconductive Materials Using Electrical Impedance Measurements


    Beteiligte:
    Ross, Richard (Autor:in) / Hinton, Yolanda (Autor:in)

    Kongress:

    49th AIAA/ASME/ASCE/AHS/ASC Structures, Structural Dynamics, and Materials Conference, 16th AIAA/ASME/AHS Adaptive Structures Conference,10th AIAA Non-Deterministic Approaches Conference, 9th AIAA Gossamer Spacecraft Forum, 4th AIAA Multidisciplinary Design Optimization Specialists Conference ; 2008 ; Schaumburg , IL



    Erscheinungsdatum :

    01.01.2008




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch




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