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    Title :

    Scanning probe microscopy for energy research




    Publication date :

    2013


    Size :

    XVI, 602 S.


    Remarks:

    Ill., graf. Darst.
    Literaturangaben



    Type of media :

    Book


    Type of material :

    Print


    Language :

    English



    Classification :

    BKL:    33.68 Oberflächen, Dünne Schichten, Grenzflächen / 53.36 Energiedirektumwandler, elektrische Energiespeicher
    DDC:    621.31/2028



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    Scanning probe microscopy for testing ultrafast electronics

    Hou, A.S. / Nechay, B.A. / Ho, F. et al. | IEEE | 1995