Effect of 40-MeV protons on semiconductors as determined with an improved method of measuring diffusion length of minority carriers
1965
19 S
Ill
Digital preservation by Technische Informationsbibliothek (TIB) / Leibniz-Informationszentrum Technik und Naturwissenschaften und Universitätsbibliothek
Book
English
British Library Conference Proceedings | 1999
|Interpretation of minority carrier diffusion length measurements in thin silicon wafers
Online Contents | 2003
|