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    Title :

    Local inspection of refractive index and thickness of thick transparent layers using spectral reflectance measurements in low coherence scanning interferometry


    Contributors:

    Published in:

    Optical materials ; 86 ; 100-105


    Publication date :

    2018-01-01


    Size :

    6 pages



    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    Unknown


    Classification :

    DDC:    535




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