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    Title :

    Model-based automatic test case generation for automotive embedded software testing


    Contributors:
    Shin, K. W. (author) / Lim, D. J. (author)

    Published in:

    Publication date :

    2018-01-01


    Size :

    13 pages



    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    English


    Classification :

    DDC:    629.2





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    Shin, K.-W. / Kim, S.s. / Park, S.M. et al. | British Library Conference Proceedings | 2014


    Automated Test Case Generation for Automotive Embedded Software Testing Using XMI-Based UML Model Transformations

    Lim, Dong-Jin / Shin, Ki-Wook / Park, Sam Min et al. | SAE Technical Papers | 2014


    Model-based testing design for embedded automotive software

    Mjeda,A. / McElligott,P. / Ryan,K. et al. | Automotive engineering | 2009