Access

    Access via TIB

    Check availability in my library

    Order at Subito €


    Export, share and cite



    Title :

    Line-Field Swept-Source Interferometer for Simultaneous Measurement of Thickness and Refractive Index Distribution


    Contributors:
    Soon-Woo, C. (author) / Gyeong, H. K. (author) / Moonju, K. (author) / Bo Sung, S. (author) / Chang-Seok, K. (author)

    Published in:

    JOURNAL OF LIGHTWAVE TECHNOLOGY ; 35 , 16 ; 3584-3590


    Publication date :

    2017-01-01


    Size :

    7 pages



    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    English


    Classification :

    DDC:    621.3692




    Low-coherence tandem interferometer for measurement of group refractive index without knowledge of thickness

    Hirai, A. / Matsumoto, H. / Guo li Taiwan da xue et al. | British Library Conference Proceedings | 2003




    Low-coherence tandem interferometer for in-situ measurement of the refractive index [4416-31]

    Hirai, A. / Matsumoto, H. / Optical Society of Japan et al. | British Library Conference Proceedings | 2001