Line-Field Swept-Source Interferometer for Simultaneous Measurement of Thickness and Refractive Index Distribution
JOURNAL OF LIGHTWAVE TECHNOLOGY ; 35 , 16 ; 3584-3590
2017-01-01
7 pages
Aufsatz (Zeitschrift)
Englisch
DDC: | 621.3692 |
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
British Library Conference Proceedings | 2003
|Low-coherence tandem interferometer for in-situ measurement of the refractive index [4416-31]
British Library Conference Proceedings | 2001
|