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    Title :

    Defect detection on images using multiple reference images: solving a binary labeling problem using graph-cuts algorithm


    Contributors:
    Lee, J. (author) / Yoo, S.I. (author)

    Published in:

    Publication date :

    2012-01-01


    Size :

    33014 pages



    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    English


    Classification :

    DDC:    535.84



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