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    Title :

    QI offers next-generation AFM imaging mode for nanometrology


    Contributors:
    Haschke, H. (author) / Jahnke, T. (author)

    Published in:

    LASER FOCUS WORLD ; 48 , 3 ; 25-30


    Publication date :

    2012-01-01


    Size :

    6 pages



    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    English


    Classification :

    DDC:    621.366




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