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    Title :

    New automatic defect classification algorithm based on a classification-after-segmentation framework


    Contributors:
    Lee, S.-H. (author) / Koo, H.-I. (author) / Cho, N.-I. (author)

    Published in:

    Publication date :

    2010-01-01


    Size :

    20502 pages



    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    English


    Classification :

    DDC:    535.84



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