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    Title :

    Precision Threshold Current Measurement for Semiconductor Lasers Based on Relaxation Oscillation Frequency


    Contributors:
    Kane, D.M. (author) / Toomey, J.P. (author)

    Published in:

    Publication date :

    2009-01-01


    Size :

    2949 pages



    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    English


    Classification :

    DDC:    621.3692



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