Precision Threshold Current Measurement for Semiconductor Lasers Based on Relaxation Oscillation Frequency
JOURNAL OF LIGHTWAVE TECHNOLOGY ; 27 , 13/16 ; 2949
2009-01-01
2949 pages
Aufsatz (Zeitschrift)
Englisch
DDC: | 621.3692 |
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Relaxation oscillation frequency properties in injection-locked semiconductor lasers
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