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    Title :

    A golden-block-based self-refining scheme for repetitive patterned wafer inspections


    Contributors:
    Guan, S. (author) / Xie, P. (author) / Li, H. (author)

    Published in:

    Publication date :

    2003-01-01


    Size :

    8 pages



    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    English


    Classification :

    DDC:    006.42



    A Golden Block Self-Generating Scheme for Continous Patterned Wafer Inspections

    Guan, S. / Xie, P. / IEEE | British Library Conference Proceedings | 1999


    A golden-template self-generating method for patterned wafer inspection

    Xie, P. / Guan, S.-U. | British Library Online Contents | 2000



    TRAFFIC INSPECTIONS

    Dellensten, B. O. / SPOKES | British Library Conference Proceedings | 2001