Quasi-Tem Analysis of a Shielded Microstrip Line of Elliptic Cross-Section with Finite Metallization Thickness Penetrating into the Substrate by the Finite Difference Method
INTERNATIONAL JOURNAL OF INFRARED AND MILLIMETER WAVES ; 21 ; 91-100
2000-01-01
10 pages
Article (Journal)
English
DDC: | 621.3612 |
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