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    Title :

    Quasi-Tem Analysis of a Shielded Microstrip Line of Elliptic Cross-Section with Finite Metallization Thickness Penetrating into the Substrate by the Finite Difference Method


    Contributors:
    Wang, Q. (author) / Liu, C. (author) / Li, Y. (author)


    Publication date :

    2000-01-01


    Size :

    10 pages



    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    English


    Classification :

    DDC:    621.3612



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