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    Title :

    Atomic Force Microscopy: AFM helps engineer low-scatter thin films


    Contributors:
    Duparre, A. (author) / Kaiser, N. (author)

    Published in:

    LASER FOCUS WORLD ; 34 , 4 ; 147-154


    Publication date :

    1998-01-01


    Size :

    8 pages



    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    English


    Classification :

    DDC:    621.366




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