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    Title :

    Ultrafast characterization of in-plane-gate field-effect transistors: parasitics in laterally gated transistors


    Contributors:
    Ogawa, K. (author) / Allam, J. (author) / De B. Baynes, N. (author) / Cleaver, J. R. A. (author) / Mishima, T. (author) / Ohbu, I. (author)


    Publication date :

    1996-01-01


    Size :

    12 pages



    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    English


    Classification :

    DDC:    537.5





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