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    Title :

    Electrooptic characterization of modulation-doped field-effect transistors with monolithically-integrated test fixtures


    Contributors:
    Zeng, A. (author) / Jackson, M. K. (author) / Van Hove, M. (author) / De Raedt, W. (author)


    Publication date :

    1996-01-01


    Size :

    8 pages



    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    English


    Classification :

    DDC:    537.5



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