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    Title :

    The Turnout Abnormality Diagnosis with Semi-supervised Learning Method


    Contributors:
    Shi, Zeng Shu (author) / Du, Yi Man (author) / Du, Tao (author) / Shan, Guo Chao (author)

    Conference:

    4th International Conference on Electrical and Information Technologies for Rail Transportation (EITRT) ; 2019 ; Qingdao, China



    Publication date :

    2020-01-01


    Size :

    10 pages



    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English



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